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Before the software can be safe, the hardware must be safe. |
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Testing embedded systems: Do you have the GuTs for it?
"Software-Based Memory Testing." by Michael Barr, February 1997.
From Analog Devices:
An IC Amplifier Users Guide to Decoupling, Grounding,and Making Things Go Right for a change.
Operational amplifiers (op amps) and comparators look similar; they even have very similar schematic symbols. This leads a lot of designers to think they are interchangeable. There is a strong temptation to use a spare section of a multiple op amp package as a comparator to save money. This application note will explain why designers should not do this.
Op-Amps and Comparators - Don't Confuse Them.
Technical Support Application Guides
From Atmel:
AVR040: EMC Design Considerations This Application Note covers the most common EMC problems designers encounter when using Microcontrollers.
From Motorola:
Engineering Bulletins:
EB349/D
RAM Data Retention Considerations for Motorola
Microcontrollers.
EB398/D
Techniques to Protect MCU Applications Against Malfunction Due
to Code Run-Away.
AN1051: Transmission Line Effects in PCB Applications.
As rise and fall times become faster in order to achieve high operating speeds, transmission line effects on PCBs can be very significant, with the possibility of unpredictable behavior. This note presents a guideline when to analyze, discusses the characteristics of different types of PCB trace, describes Lattice Diagram and Bergeron Plot analysis, and summarizes termination methods. Includes 10 worked examples.
AN1061:
Reflecting on Transmission Line Effects.
AN1259/D
System Design and Layout Techniques for Noise Reduction in
MCU-Based Systems.
AN1263/D
Designing for Electromagnetic Compatibility with Single- Chip
Microcontrollers.
AN1705/D
Noise Reduction Techniques for Microcontroller-Based
Systems.
AN1744/D
Resetting Microcontrollers During Power Transitions.
AN2321/D
Designing for Board Level Electromagnetic
Compatibility.
From TI:
Op Amps and Comparators - Don't Confuse ThemOperational amplifiers (op amps) and comparators look similar; they even have very similar schematic symbols. This leads a lot of designers to think they are interchangeable. There is a strong temptation to use a spare section of a multiple op amp package as a comparator to save money. This application note will explain why designers should not do this.
Download .pdf (sloa067.pdf, 150 Kbytes)
Analog Devices gives simular advice.
From Zilog:
Minimizing
EMI Effects During PCB Layout of Z8/Z8Plus Circuits.
Using
Software Techniques to Maximize Z8 MCU System Noise
Immunity.
The Reliability Analysis Center (RAC) is a DoD Information Analysis Center (IAC). The RAC is chartered by the DoD to collect, analyze, and disseminate data and information in a designated technical area of specialization. Information is distributed to DoD and industry via data bases, methodology handbooks, state-of- the-art technology reviews, training courses, and consulting services.
RAC's scope is the reliability, maintainability, quality and supportability of microcircuits, semiconductors, electromechanical and mechanical parts, and equipment/systems employing these parts.
PRISM® is the new Reliability Analysis Center (RAC) software tool that ties together several tools into a comprehensive system reliability prediction methodology. The PRISM concept accounts for the myriad of factors that can influence system reliability, combining all those factors into an integrated system reliability assessment resource.
PRISM was developed to overcome inherent limitations in MIL-HDBK-217 that is no longer being actively maintained or updated by the Department of Defense (DoD).
PRISM fills this void by providing a superior approach for reliability modeling under a broad range of applications.